Scanning Electron Microscope(sem) - メーカー・企業と製品の一覧

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Technical Data: Low Vacuum SEM (Observation and Evaluation of Adhesive Interfaces)

Technical Data: Low Vacuum SEM (Observation and Evaluation of Adhesive Interfaces)

Introduction to observation and evaluation analysis of low vacuum SEM that does not require coating processes such as vacuum deposition!

Our company is engaged in the analysis solution business. In low vacuum SEM, coating treatments (pre-treatments) such as vacuum deposition are not required for sample preparation. Even for samples such as insulators, semiconductors, and food, after low vacuum SEM observation without coating treatment, they can be directly used for other analyses. [Contents] ■ Overview ■ Analysis Examples ・ Observation and evaluation of adhesive interfaces *For more details, please refer to the PDF document or feel free to contact us.

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FE-SEM observation (Crystal grain observation of Al wire bonding section)

FE-SEM observation (Crystal grain observation of Al wire bonding section)

High-brightness electron gun for detailed SEM images! Equipped with an in-lens SE detector sensitive to surface information.

The ZEISS "FE-SEM ULTRA55" is equipped with a GEMINI column, allowing for high-resolution observation at extremely low acceleration voltages. It also features multiple detectors, enabling the observation of various samples. Composition information can be obtained using two types of backscattered electron detectors, and high-resolution EDX analysis is possible even at low acceleration voltages. 【Features】 ■ High-resolution SEM images with a high-brightness electron gun ■ Ultra-surface analysis at extremely low acceleration voltages ■ In-lens SE detector sensitive to surface information ■ Composition information obtained using two types of backscattered electron detectors ■ High-resolution EDX analysis even at low acceleration voltages ■ Observation without coating *For more details, please refer to the PDF document or feel free to contact us.

  • Analysis and prediction system

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Technical Data: Low Vacuum SEM

Technical Data: Low Vacuum SEM

Introducing a case study that analyzed the cross-sectional structure of solar panels using only cutting and polishing as a preprocessing method!

Our company is engaged in the analysis solution business. This document presents a case study where the cross-sectional structure of an insulator solar panel composed of organic-inorganic composites was analyzed using low vacuum SEM and FT-IR, with only cutting and polishing as the pretreatment. In low vacuum SEM, coating treatments such as vacuum deposition are not required as pretreatment for the samples. For samples such as insulators, semiconductors, and food, it is possible to conduct other analyses directly after low vacuum SEM observation without any coating treatment. [Contents] ■ Overview ■ Analysis Case ・ Analysis of Solar Panels (Insulators) *For more details, please refer to the PDF document or feel free to contact us.

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"Damage analysis" Proven track record of analyzing approximately 3,000 equipment troubles!

"Damage analysis" Proven track record of analyzing approximately 3,000 equipment troubles!

By investigating the true cause of the troubles that occurred with the equipment, it becomes possible to formulate effective countermeasures!

By analyzing the damaged areas caused by equipment troubles in detail, we can investigate the true causes of the issues that occurred and propose measures to help prevent recurrence and improve the situation. Utilizing over 40 years of experience and expertise within the Toray Group, we employ various tools such as electron microscopes and component analysis devices to address our customers' inquiries. 【Examples of Analysis Equipment】 ■ Scanning Electron Microscope (SEM) ■ Energy Dispersive X-ray Spectroscopy (EDS) ■ Hardness Tester ■ Various Optical Microscopes, etc.

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  • Structural Survey

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